PASSAT: Effcient SAT-based test pattern generation for industrial circuits. Automatic test pattern generation (ATPG) based on Boolean satisfiability (SAT) has been proposed as an alternative to classical search algorithms. SAT-based ATPG turned out to be more robust and more effective by formulating the problem as a set of equations. In this paper, we present an efficient ATPG algorithm that makes use of powerful SAT-solving techniques. Problem specific heuristics are applied to guide the search. In contrast to previous SAT-based algorithms, the new approach can also cope with tri-states. The algorithm has been implemented as the tool PASSAT. Experimental results on large industrial circuits are given to demonstrate the quality and efficiency of the algorithm.
References in zbMATH (referenced in 3 articles )
Showing results 1 to 3 of 3.
- Drechsler, R.; Eggersglüß, S.; Fey, G.; Tille, D.: Test pattern generation using Boolean proof engines (2009)
- Fey, Görschwin; Drechsler, Rolf: Robustness and usability in modern design flows (2008)
- Drechsler, Rolf; Fey, Görschwin: Automatic test pattern generation (2006)