diffractometry: Baseline identification and peak decomposition for x-ray diffractograms. Residual-based baseline identification and peak decomposition for x-ray diffractograms as introduced in Davies/Gather/Mergel/Meise/Mildenberger (2008).
Keywords for this software
References in zbMATH (referenced in 3 articles , 1 standard article )
Showing results 1 to 3 of 3.
- Koenker, Roger: Comment on “Local quantile regression” (2013)
- Hotz, Thomas; Marnitz, Philipp; Stichtenoth, Rahel; Davies, Laurie; Kabluchko, Zakhar; Munk, Axel: Locally adaptive image denoising by a statistical multiresolution criterion (2012)
- Davies, P.L.; Gather, U.; Meise, M.; Mergel, D.; Mildenberger, T.: Residual-based localization and quantification of peaks in X-ray diffractograms (2008)