AETG

The AETG system: an approach to testing based on combinatorial design. This paper describes a new approach to testing that uses combinatorial designs to generate tests that cover the pairwise, triple, or n-way combinations of a system’s test parameters. These are the parameters that determine the system’s test scenarios. Examples are system configuration parameters, user inputs and other external events. We implemented this new method in the AETG system. The AETG system uses new combinatorial algorithms to generate test sets that cover all valid n-way parameter combinations. The size of an AETG test set grows logarithmically in the number of test parameters. This allows testers to define test models with dozens of parameters. The AETG system is used in a variety of applications for unit, system, and interoperability testing. It has generated both high-level test plans and detailed test cases. In several applications, it greatly reduced the cost of test plan development.


References in zbMATH (referenced in 40 articles )

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  1. Demirkale, Fatih; Donovan, Diane; Hall, Joanne; Khodkar, Abdollah; Rao, Asha: Difference covering arrays and pseudo-orthogonal Latin squares (2016)
  2. Akhtar, Yasmeen; Maity, Soumen; Chandrasekharan, Reshma C.: Covering arrays of strength four and software testing (2015)
  3. Chodoriwsky, Jacob; Moura, Lucia: An adaptive algorithm for group testing for complexes (2015)
  4. Rodriguez-Tello, Eduardo; Romero-Monsivais, Hillel; Ramirez-Torres, Gabriel; Lardeux, Frédéric: Tabu search for the cyclic bandwidth problem (2015)
  5. Choi, Soohak; Kim, Hyun Kwang; Oh, Dong Yeol: Structures and lower bounds for binary covering arrays (2012)
  6. Lobb, Jason R.; Colbourn, Charles J.; Danziger, Peter; Stevens, Brett; Torres-Jimenez, Jose: Cover starters for covering arrays of strength two (2012)
  7. Torres-Jimenez, Jose; Rodriguez-Tello, Eduardo: New bounds for binary covering arrays using simulated annealing (2012)
  8. Colbourn, Charles J.: Constructing heterogeneous hash families by puncturing linear transversal designs (2011)
  9. Colbourn, Charles J.; Shi, Ce; Wang, Chengmin; Yan, Jie: Mixed covering arrays of strength three with few factors (2011)
  10. Zamli, Kamal Z.; Klaib, Mohammad F.J.; Younis, Mohammed I.; Isa, Nor Ashidi Mat; Abdullah, Rusli: Design and implementation of a t-way test data generation strategy with automated execution tool support (2011)
  11. Calvagna, Andrea; Gargantini, Angelo: A formal logic approach to constrained combinatorial testing (2010)
  12. Clifford, Raphaël; Efremenko, Klim; Porat, Ely; Rothschild, Amir: Pattern matching with don’t cares and few errors (2010)
  13. Colbourn, Charles J.; Torres-Jimenez, Jose: Heterogeneous hash families and covering arrays (2010)
  14. Gonzalez-Hernandez, Loreto; Rangel-Valdez, Nelson; Torres-Jimenez, Jose: Construction of mixed covering arrays of variable strength using a tabu search approach (2010)
  15. Ji, Lijun; Yin, Jianxing: Constructions of new orthogonal arrays and covering arrays of strength three (2010)
  16. Colbourn, Charles J.; Kéri, Gerzson: Binary covering arrays and existentially closed graphs (2009)
  17. Colbourn, Charles J.; Ling, Alan C.H.: Linear hash families and forbidden configurations (2009)
  18. Ronneseth, Andreas H.; Colbourn, Charles J.: Merging covering arrays and compressing multiple sequence alignments (2009)
  19. Walker, Robert A. II; Colbourn, Charles J.: Tabu search for covering arrays using permutation vectors (2009)
  20. Bulutoglu, D.A.; Margot, F.: Classification of orthogonal arrays by integer programming (2008)

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