Software for Life Data Analysis. Click here for information on SPLIDA, a collection of S-Plus functions for Reliability Data Analysis. These functions were developed and used for the purpose of doing the examples in Meeker and Escobar. Included in the distribution are data sets and instructions on how to replicate almost all of the analyses in Meeker and Escobar. The current version of SPLIDA has an S-Plus graphical user interface (GUI) for much of its functionality. This version of SPLIDA will work S-Plus versions 6.x and 7.x. A command version of SPLIDA for R is under development.

References in zbMATH (referenced in 249 articles , 1 standard article )

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  1. Wu, Shuo-Jye; Lin, Ying-Po; Chen, Shyi-Tien: Optimal step-stress test under type I progressive group-censoring with random removals (2008)
  2. Balakrishnan, N.; Xie, Qihao: Exact inference for a simple step-stress model with type-I hybrid censored data from the exponential distribution (2007)
  3. Balakrishnan, N.; Xie, Qihao: Exact inference for a simple step-stress model with type-II hybrid censored data from the exponential distribution (2007)
  4. Bebbington, Mark; Lai, Chin-Diew; Zitikis, Ričardas: Reliability of modules with load-sharing components (2007)
  5. Ruiz, Rubén; García-Díaz, J. Carlos; Maroto, Concepción: Considering scheduling and preventive maintenance in the flowshop sequencing problem (2007)
  6. Zhang, Tieling; Xie, Min: Failure data analysis with extended Weibull distribution (2007)
  7. Bousquet, Nicolas; Bertholon, Henri; Celeux, Gilles: An alternative competing risk model to the Weibull distribution for modelling aging in lifetime data analysis (2006)
  8. Ebrahem, Mohammed Al-Haj; Higgins, James J.: Non-parametric analysis of a proportional wearout model for accelerated degradation data (2006)
  9. Escobar, Luis A.; Meeker, William Q.: A review of accelerated test models (2006)
  10. Kundu, Debasis; Joarder, Avijit: Analysis of type-II progressively hybrid censored data (2006)
  11. Lindqvist, Bo Henry: On the statistical modeling and analysis of repairable systems (2006)
  12. Muralidharan, K.; Lathika, P.: Analysis of instantaneous and early failures in Weibull distribution (2006)
  13. Park, Chanseok; Padgett, W. J.: A general class of cumulative damage models for materials failure (2006)
  14. Patilea, Valentin; Rolin, Jean-Marie: Product-limit estimators of the survival function with twice censored data (2006)
  15. Vilca-Labra, Filidor; Leiva-Sánchez, Víctor: A new fatigue life model based on the family of skew-elliptical distributions (2006)
  16. Yang, Zhenlin: A modified family of power transformations (2006)
  17. Yu, Hong-Fwu: Designing an accelerated degradation experiment with a reciprocal Weibull degradation rate (2006)
  18. Kharoufeh, Jeffrey P.; Sipe, Jeffrey A.: Evaluating failure time probabilities for a Markovian wear process (2005)
  19. Kiessler, Peter C.; Nimitkiatklai, Kanoktip: The lifetime of a random set (2005)
  20. Rao, Poduri S. R. S.; Zaino, Nicholas A.: Reliability estimation through the linear mixed effects model (2005)

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