AETG

The AETG system: an approach to testing based on combinatorial design. This paper describes a new approach to testing that uses combinatorial designs to generate tests that cover the pairwise, triple, or n-way combinations of a system’s test parameters. These are the parameters that determine the system’s test scenarios. Examples are system configuration parameters, user inputs and other external events. We implemented this new method in the AETG system. The AETG system uses new combinatorial algorithms to generate test sets that cover all valid n-way parameter combinations. The size of an AETG test set grows logarithmically in the number of test parameters. This allows testers to define test models with dozens of parameters. The AETG system is used in a variety of applications for unit, system, and interoperability testing. It has generated both high-level test plans and detailed test cases. In several applications, it greatly reduced the cost of test plan development.


References in zbMATH (referenced in 71 articles )

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  1. Maity, Soumen; Colbourn, Charles J.: Mixed covering arrays on graphs of small treewidth (2022)
  2. Kacker, Raghu N.; Kuhn, D. Richard; Lei, Yu; Simos, Dimitris E.: Factorials experiments, covering arrays, and combinatorial testing (2021)
  3. Wagner, Michael; Kampel, Ludwig; Simos, Dimitris E.: Heuristically enhanced IPO algorithms for covering array generation (2021)
  4. Akhtar, Yasmeen; Phoa, Frederick Kin Hing: Cost-efficient mixed-level covering designs for testing experiments (2020)
  5. Bistrigova, Anastasiya V.: Attribute-efficient learning of Boolean functions from post closed classes (2020)
  6. Kampel, Ludwig; Leithner, Manuel; Simos, Dimitris E.: Sliced AETG: a memory-efficient variant of the AETG covering array generation algorithm (2020)
  7. Kampel, Ludwig; Leithner, Manuel; Garn, Bernhard; Simos, Dimitris E.: Problems and algorithms for covering arrays via set covers (2019)
  8. Kampel, Ludwig; Simos, Dimitris E.: A survey on the problems and algorithms for covering arrays via set covers (2019)
  9. Torres-Jimenez, Jose; Perez-Torres, Jose Carlos: A greedy algorithm to construct covering arrays using a graph representation (2019)
  10. Colbourn, Charles J.; Lanus, Erin; Sarkar, Kaushik: Asymptotic and constructive methods for covering perfect hash families and covering arrays (2018)
  11. Colbourn, Charles J.; Syrotiuk, Violet R.: On a combinatorial framework for fault characterization (2018)
  12. Kampel, Ludwig; Garn, Bernhard; Simos, Dimitris E.: Covering arrays via set covers (2018)
  13. Kleine, Kristoffer; Simos, Dimitris E.: An efficient design and implementation of the in-parameter-order algorithm (2018)
  14. Maity, Soumen; Akhtar, Yasmeen; Chandrasekharan, Reshma C.; Colbourn, Charles J.: Improved strength four covering arrays with three symbols (2018)
  15. Pill, Ingo; Wotawa, Franz: Fault detection and localization using Modelica and abductive reasoning (2018)
  16. Akhtar, Yasmeen; Maity, Soumen: Mixed covering arrays on 3-uniform hypergraphs (2017)
  17. Akhtar, Yasmeen; Maity, Soumen: Covering arrays on product graphs (2017)
  18. Garn, Bernhard; Simos, Dimitris E.: Algebraic modelling of covering arrays (2017)
  19. Demirkale, Fatih; Donovan, Diane; Hall, Joanne; Khodkar, Abdollah; Rao, Asha: Difference covering arrays and pseudo-orthogonal Latin squares (2016)
  20. Akhtar, Yasmeen; Maity, Soumen; Chandrasekharan, Reshma C.: Covering arrays of strength four and software testing (2015)

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